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An extended component-based reliability model for protective systems to determine routine test schedule
Reliability protective system routine test redundancy
2011/3/23
This paper presents a novel approach for evaluating the reliability of protective systems taking into account its components reliability. In this paper, a previously proposed extended model is used fo...
Development of a magnetic field model and insertion~into a commercial electromagnetic simulator
magnetic field model insertion commercial electromagnetic simulator
2010/1/11
To take into account~certain ElectroMagnetic Compatibility (EMC) aspects~and especially to evaluate the magnetic fields radiated by electronic components, different radiated emission models have been ...
Statistical Model of Hot-Carrier Degradation and Lifetime Prediction for P-MOS Transistors
Hot-carrier P-MOS transistor lifetime prediction
2009/7/28
Along with advances in microelectronics, and computer and space technologies, device dimensions are becoming smaller; as a result, hot-carrier effect, lifetime prediction, and reliability become more ...
Voltage Degradation Model of Thin Film Capacitors
Voltage Degradation Model Thin Film Capacitors
2010/12/23
A degradation model of thin film capacitors is presented. This model takes into consideration that: (a) the damage rate dD/dt is a function of the damage value D, and (b) the critical damage Dc is a f...